Ionizing Radiation Effects in MOS Devices and Circuits

Ionizing Radiation Effects in MOS Devices and Circuits

4.11 - 1251 ratings - Source



The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.A. R. Knudson and A. B. Campbell, aquot;Use of an Ion Microbeam to Study Single Event Upsets in Microcircuits, aquot; IEEE Trans. Nucl. Sci. NS-28, 4017- 4021 (1981). 167. John A. Zoutendyk. aquot;Modeling of Single Event Upset in Bipolar Integratedanbsp;...


Title:Ionizing Radiation Effects in MOS Devices and Circuits
Author: T. P. Ma, Paul V. Dressendorfer
Publisher:John Wiley & Sons - 1989-04-18
ISBN-13:

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.

How it works:
  • 1. Register a free 1 month Trial Account.
  • 2. Download as many books as you like (Personal use)
  • 3. Cancel the membership at any time if not satisfied.


Click button below to register and download Ebook
Privacy Policy | Contact | DMCA